Quality Information

Quality Management System certification

Epson quickly began working to acquire company-wide ISO certification. Electronic Devices; Semiconductor has acquired ISO9001 and IATF16949(ISO/TS16949) certification with its IC, module and their application products.


Type of Certification ISO9001: 2015 , JIS Q 9001: 2015
Awarded to Semiconductor Operations Fujimi Plant, Hino Office, Suwa Minami Plant, Tohoku Epson Corp.
Certified by Bureau Veritas Japan Co., Ltd.
Certificate No. 3762381
Initial Date of Certification October 10, 1993
Date of expiration December 10, 2019
Certificate ISO9001 Certificate (Sakata, Fujimi, Hino, Suwa-minami) PDF (740KB)
Type of Certification ISO9001: 2008
Awarded to Singapore Epson Industrial Pte. Ltd.
Certified by SGS
Certificate No. SG03/00011
Initial Date of Certification February 4, 2003
Date of expiration September 15, 2018
Certificate ISO9001 Certificate (SEP) PDF (787KB)


Type of Certification IATF16949:2016-First Edition
Awarded to TOHOKU EPSON Corp, SEIKO EPSON CORPORATION (Fujimi Plant, Suwaminami Plant, Hino Office), EPSON EUROPE ELECTRONICS GmbH
Certified by Bureau Veritas Japan Co., Ltd.
Certificate No. 281371
Initial Date of Certification December 9, 2017
Date of expiration December 8, 2020
Certificate IATF16949 Certificate (Sakata) PDF (551KB)
Type of Certification ISO/TS16949:2009
Awarded to Singapore Epson Industrial Pte. Ltd.
Certified by SGS
Certificate No. SG07/00021
Initial Date of Certification June 7, 2007
Date of expiration September 14, 2018
Certificate ISO/TS16949 Certificate (SEP) PDF (1.9MB)

Note; Please scrap the pdf file or print of certificates properly when the date of expiration has passed.

ISO9001 is an international standard for a product quality system that prescribes demands to the manufactures on a standpoint of customers.

IATF16949 is an international standard of Quality management system for Automotive industry.

IC Quality Assurance Handbook

Epson semiconductor product quality assurance guidebook PDF (780KB)

Products Credibility Activities

We would set test item and sample depend on not only intended use or usage environment for devices also novelty and priority of products, then we would test reliability evaluation. We would curry out a environment test and mechanical test according to product type. The product specificity is considered in order to adapt various product type and the test condition is set accordingly.

Qualification Test items (example)

Temperature cycling
-65°C to 150°C 200CYC.
  • JEITA ED-4701/100A
  • JEDEC JESD22-A104
High Temperature operating life
125°C / Vdd-max 1000h
  • JEITA ED-4701/100A
  • JEDEC JESD22-A108
High Temperature humidity bias
85°C / 85%RH 1000h
  • JEITA ED-4701/100A
  • JEDEC JESD22-A101
High Temperature storage
150°C 1000h
  • JEITA ED-4701/200A
  • JEDEC JESD22-A103
Low temperature storage -65°C 1000h
  • JEITA ED-4701/200A
Pressure cooker
121°C / 2.0E5Pa 200h
  • JEITA ED-4701/100A
  • JEDEC JESD22-A102
Resistance to soldering heat Moisture soaking → reflow 3 Time
  • JEITA ED-4701/301
  • J-STD-020D.01
Resistance to solvent
(Permanence of marking)*1
IPA 1 Time
  • JEITA ED-4701/500A

*1: Applies to ink mark only

Mechanical Test items (example)

Thermal strength
(Pull test)
2.5N, 10 seconds 1 Time
  • JEITA ED-4701/400A
  • JEDEC JESD22-B105
Thermal strength
(Bending test)
90 degree bend 2 Time
  • JEITA ED-4701/400A
  • JEDEC JESD22-B105
Solderability 1 (Pb free) Steam Aging → solder dipping 4h → 245°C, 5seconds
  • JEITA ED-4701/301
  • JEDEC JESD22-B102
Solderability 2 (Pb free) baking → solder dipping 150°C, 16h → 245°C, 5seconds
  • JEITA ED-4701/301
  • JEDEC JESD22-B102

ESD Test Procedure

With ICs miniaturization, obvious damages by ESD-Electrostatic-Discharge- are recognized. Epson would carry out ESD test in official standard and approve a product.

In order to determine the susceptibility levels of our device to ESD potential,testing in performed using the test circuit.

  1. After charging the condenser, switch the "SW" and apply the test voltage on each pins.
  2. Measure the all electrical parameters and the functions.
  3. If no failure is found, increase the voltage in steps. Continue testing until failure occurs.