Seiko Epson Corporation

Epson Releases NS-8010 Series of Compact IC Test Handlers

– TOKYO, Japan, November 19, 2009 –

Seiko Epson Corporation ("Epson", TSE:6724) today announced the release of the new NS-8010 series of IC test handlers. Shipments are scheduled to commence in late November.
The new NS-8010 series was developed to help customers reduce testing costs with a selection of compact, low-price models, extending Epson's NS-8000 series of high-speed, high-accuracy IC test handlers.

Product features

• Low-price series helps reduce testing costs
  • Low price achieved by developing new dedicated unit for room temperature tests
  • Lineup includes four models, from room temperature units to high temperature units
• Small footprint
  • Saves factory floor space with a width of only 1,400 mm
  • Takes up 18% less space than Epson's previous model
• Enables utilization of existing assets
  • Compatible with changeover kits for the NS-6000 and NS-8000 series

Main specifications

• Parallel test sites : 2 sites, 4 sites
• Test temperature : Room temperature, high temperature
• Throughput : Up to 8,000 units per hour
• Tray classification : 3 classes

See the attachment for product details. (65KB)
Specifications are subject to change without notice.

Product exhibition

One of the new test handlers will be on display at SEMICON Japan to be held at Makuhari Messe, Chiba, Japan, from December 2 to 4.
Epson will be at booth number 8A-501 in hall 8. We hope to see you there.

Related information

To learn more about Epson's IC handlers, visit:
http://www.epson.jp/e/products/handler/

For sales enquiries, please locate your regional Epson IC handler distributor at:
http://www.epson.jp/e/products/handler/support/